Conference record

Date :

Editeur / Publisher : [New York, N.Y.] : Institute of Electrical and Electronics Engineers , 1995-1996

Type : Périodique / Serial

Langue / Language : anglais / English

Classification Dewey : 629

Relation : Conference record / Autotestcon / [New York, N.Y.] : Institute of Electrical and Electronics Engineers , c1995-c1996